Whisker

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15.02.2005
Whisker
single crystals, protruding from electroplated layers, originating from diffusion under the influence of compressive stress
Whisker formation with lead free plating is a known phenomenon. Whiskers are single crystals, protruding from electroplated layers, originating from diffusion under the influence of compressive stress.
Long whiskers can have influence on quality of electronic devices as those can cause short circuits. It is therefore important to understand the root cause of whisker growth.

Four different forms are defined: filament, nodule, mound, column

See Root Causes of Tin Whisker Research Root Causes of Tin Whisker Research for an example of a whisker.